White X-ray radiation diffraction in crystals analysis by Ewald method in determining crystal lattice angular parameters

Authors

  • Игорь Александрович Тренинков (Igor A. Treninkov) Federal state unitary enterprise “All-Russian Scientific Research Institute of Aviation Materials”
  • Александр Яковлевич Кочубей (Alexandr Ya. Kochubey) Federal state unitary enterprise “All-Russian Scientific Research Institute of Aviation Materials”

DOI:

https://doi.org/10.17072/1994-3598-2021-1-40-48

Keywords:

кристаллическая решётка, обратная решётка, белое рентгеновское излучение, ω-сканирование, рентгеновская гониометрия

Abstract

Using the Ewald method, the analysis a diffraction pattern formation in the interaction of white x-ray radiation with crystals in the process of diffraction shooting by the ω-scanning method using a point counter is carried out. The influence of such parameters as x-ray voltage x-ray tube and the angular the counter position to the number and intensity of reflections on x-rays. It is shown that the angles between the diffraction maxima on the diffractograms obtained by ω-scanning using white x-ray radiation are equal to the angles between the corresponding crystallographic planes. The angles and crystallographic indices of the reflecting crystals planes of some simple substances were measured using the considered x-ray survey.

References

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Blokhin M. A. Physics of X-rays. Oak-Ridge, USA: U.S. Atomic Energy Commission, 1957. 429 p.

Novikov I. I., Rozin K. M. Crystallography and crystal lattice defects. Moscow: Metallurgy, 1990. 336 p. (In Russian).

Vasiliev D. M. Diffraction methods for studying structures. Moscow: Metallurgy, 1977. 247 p.

Gorelik S. S., Skakov Yu. A., Rastorguev L. N. Radiographic and electronoptical analysis. Moscow: Metallurgy, 1970, 366 p. (In Russian).

Kochubey A. Ya., Treninkov I. A. Analysis of white X-ray diffraction on crystals by Ewald method in the construction of straight pole figures. News of materials science. Science and technology: electronic journal, 2018, no. 5–6. pp. 71–77. URL: http://www.materialsnews.ru (date accessed: 05.04.2019).

Published

2021-04-05

How to Cite

Тренинков (Igor A. Treninkov) И. А., & Кочубей (Alexandr Ya. Kochubey) А. Я. (2021). White X-ray radiation diffraction in crystals analysis by Ewald method in determining crystal lattice angular parameters. Bulletin of Perm University. Physics, (1). https://doi.org/10.17072/1994-3598-2021-1-40-48

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Section

Regular articles

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