White X-ray radiation diffraction in crystals analysis by Ewald method in determining crystal lattice linear parameters

Authors

  • Александр Яковлевич Кочубей (Alexander Ya. Kochubey) Federal state unitary enterprise “All-Russian scientific research institute of aviation materials”
  • Игорь Александрович Тренинков (Igor A. Treninkov) Federal state unitary enterprise “All-Russian scientific research institute of aviation materials”

DOI:

https://doi.org/10.17072/10.17072/1994-3598-2020-1-43-51

Keywords:

continuous roentgen spectrum, white X-radiation, lattice spacing, crystal structure, Ewald structure

Abstract

The possibility of using the short-wave boundary of white X-ray radiation for the experimental determination of the linear parameters of the crystal lattice is shown. Two variants of X-ray exposure are considered, which allows to fix the diffraction effect underlying the determination of linear parameters: shooting when the voltage on the X-ray tube and the constant angle of diffraction, as well as exposure when the diffraction angle and the constant voltage on the tube change. For both variants of the exposure, calculation formulas are obtained that allow experimentally determining the linear parameters of the lattice. With the application of the considered types of exposure and the resulting calculation formulas determined the interplanar distances in the crystals of some simple substances.

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Published

2020-03-25

How to Cite

Кочубей (Alexander Ya. Kochubey) А. Я., & Тренинков (Igor A. Treninkov) И. А. (2020). White X-ray radiation diffraction in crystals analysis by Ewald method in determining crystal lattice linear parameters. Bulletin of Perm University. Physics, (1). https://doi.org/10.17072/10.17072/1994-3598-2020-1-43-51

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